Light matter interactions have fundamental importance in today’s science to explore the behavior of material systems on nanometers scale. ELI-ALPS provides unique opportunity to explore new areas in chemistry not possible previously. The wavelength of light produced at ELI-ALPS is comparable to the size of natural (proteins, DNA etc.) and artificial molecular assemblies (semiconductor quantum dots, nanodiscs, nanorods, nanotubes, metal nanoparticles, graphene, layered quantum dots etc.) on nanometer scale, enabling us to investigate electronic behaviors of these systems. With the help of ELI-ALPS’s new exciting capabilities, the intensity of electromagnetic radiation at terahertz will be sufficient to exert perturbation on these nanosystems well-beyond the weak regime. The terahertz frequencies available at ELI-ALPS are below the natural resonance frequencies (electronic and vibrational) of common materials.

The beamline provides opportunity to investigate the intense terahertz process in the gas phase and in the condense phase. First, the beamline provides opportunity to study XUV photoinduced gas phase photodissociation processes in the presence of intense terahertz radiation. The terahertz radiation can produce an important control on the outcome of these simple chemical reactions such as molecular alignment and modulation of the dissociation pathways. These experiments can be realized in the reaction chamber where attosecond XUV pulses and terahertz pulses are combined. The chemiluminescence of the molecular fragments are recorded with the help of high resolution step scan Fourier Transform UV/Visible, IR spectrometer. Second, the beamline will allow to perform transient absorption measurements to study the impact of the intense terahertz in photo induced processes on condense phase molecular and photophysical processes.


Additional Lightsources

Broadband Terahertz probe

Laser type
Conical broadband terahertz emission from two-color laser-induced plasma filaments
Central Wavelength/Energy
15000 [nm]
Wavelength fluctuations
5 [%]
Spectral Bandwidth FWHM
500 [meV]
Tunability
5 [%]
Beam shape
Gaussian
Pulse duration FWHM
0.5 [ps]
Pulse repetition rate
1000 [Hz]
Maximum pulse energy
40 * 10-9 [J]
Peak power
8 [W]
Peak fluence on target
-3 [J/cm2]

Terahertz probe(narrow)

Laser type
Terahertz generation via optical rectification in ZnTe crystal
Central Wavelength/Energy
200000 [nm]
Wavelength fluctuations
5 [%]
Spectral Bandwidth FWHM
25 [meV]
Tunability
5 [%]
Beam shape
Gaussian
Pulse duration FWHM
1 * 10-12 [s]
Pulse repetition rate
1000 [Hz]
Maximum pulse energy
10 * 10-9 [J]
Peak power
1 * 104 [W]

Terahertz pump

Laser type
Generation of high-power terahertz pulses by tilted-pulse-front excitation
Central Wavelength/Energy
300000 [nm]
Wavelength fluctuations
2 [%]
Spectral Bandwidth FWHM
15 [meV]
Tunability
5 [%]
Beam shape
Gaussian
Pulse duration FWHM
1 * 10-12 [s]
Pulse repetition rate
1000 [Hz]
Maximum pulse energy
200 * 10-9 [J]
Peak power
1 * 105 [W]

UV-VIS pump

Central Wavelength/Energy
400 [nm]
Wavelength fluctuations
10 [%]
Spectral Bandwidth FWHM
30 - 150 [nm]
Tunability
5 [%]
Beam shape
Gaussian
Pulse duration FWHM
10 * 10-15 [s]
Pulse repetition rate
1000 [Hz]
Maximum pulse energy
5 [mJ]
Peak power
5 * 1011 [W]

white ligth probe

Central Wavelength/Energy
500 [nm]
Wavelength fluctuations
20 [%]
Spectral Bandwidth FWHM
100 - 300 [nm]
Tunability
10 [%]
Beam shape
Gaussian
Pulse duration FWHM
10 * 10-15 [s]
Pulse repetition rate
1000 [Hz]
Maximum pulse energy
1 [mJ]
Peak power
1 * 1012 [W]
Endstations or Setup

Reaction chamber

Spectrometer
Bruker Vertex 80 FTVIS/IR spectrometer with step scan option (time resolved measurements)
Base Pressure
1 * 10-4 [torr]
Detectors Available
Silicon detectors
GaP detector
Si avalanche detector
Photomultiplier tube

Sample

Sample Type
Gas

Transient Absorption Spectrometer

Spectrometer
Bruker Vertex 80 step scan spectrometer

Sample

Sample Type
Crystal, Amorphous, Fiber, Gel, Liquid, Gas
Detectors

Fiber optic spectrometer

Type
QEPro Ocean Optics Spectrometer
Description
The QE Pro is a high sensitivity spectrometer with low stray light performance. It is ideal for a wide range of low light level applications such as fluorescence, DNA sequencing and Raman analysis
Time Resolved
Yes
Passive or Active (Electronics)
Active

Detection

Detected Particle
Photon

FT UV/VIS/IR Spectrometer

Type
Bruker Optics Vertex 80
Description
The VERTEX 80 and the VERTEX 80v vacuum FTIR spectrometers are based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optics guarantees the ultimate sensitivity and stability. The VERTEX 80v is an evacuated optics bench that can eliminate atmospheric moisture absorptions for ultimate sensitivity and stability; enabling demanding experiments such as high resolution, ultra fast rapidscan, step-scan, or UV spectral range measurements.
Time Resolved
Yes
Passive or Active (Electronics)
Active
Output Readout Software
OPUS/Labview

Detection

Detected Particle
Electron

GaP detector

Type
Bruker D520/B
Description
GaP diode detector, spectral range: 50,000-18,000 cm-1, 2.4 x 2.4 mm
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

MCT detector

Type
Bruker D316/BF
Description
12,000 - 600 cm-1, mid band, liquid N2 cooled
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

Photomultiplier tube

Type
H10721P-113 -Hamamatsu
H10721-113 - Hamamatsu
Description
The H10721 series are photosensor modules containing a metal package PMT and a high-voltage power supply circuit. The built-in PMT uses a metallic package with the same diameter as a TO-8 metal package used for semiconductor photodetectors. Despite the small size nearly equal to photodiodes, this PMT delivers high gain, wide dynamic range, and high-speed response. Hamamatsu provided "P" type with low dark count selected for photon counting measurement.
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

Si avalanche detector

Type
APD410A2/M - Thorlabs
Description
Si Variable-Gain Avalanche Detector, Temperature Compensated, UV Enhanced, 200 - 1000 nm, DC - 10 MHz, M4 Taps
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

Silicon detectors

Type
PDA100A - Thorlabs
Description
Si Switchable Gain Detector, 340 - 1100 nm, 2.4 MHz BW, 100 mm2, 8-32 Taps
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron
Support Laboratories

Chemical Preparatory Laboratory

Description

General purpose chemistry laboratory, which supports the sample/target preparation of the users. It is equipped with the basic chemistry laboratory tools. These include (among others):

-       Glovebox with controlled O2 and H2O content

-       Fume hoods

-       Analytical balance

-       Plasma cleaner

-       Ultrasonic bath

-       Temperature controlled water bath

-       pH meter

-       Hotplate

-       High temperature furnace

-       Vacuum dryer with heating capacity

-       Microcentrifuge

-       General purpose glassware and plasticware (beakers, pipettes, vials)

In addition, a state-of-the-art electrochemical workstation is also available, which includes a potentiosat/galvanostat with fast sampling capabilities, equipped with electrochemical impedance spectroscopy module as well as IMPS/IMVS setup.


Electrical Workshop

Description

Serious contribution to the Research Technology installations / commissioning, including each primary sources and beamlines, PSS, MPS, timing, DAQI and all the related facility systems. Highly equipped electrical workshop to allow members and users to access full spectrum of available solutions.

Some of the core capabilities/main instruments:

-Oscilloscope (from 350MHz 5GSa, till 4GHz, 20GSa, 4 channel)
-Special supplies for laboratory use
-Signal generator for delay/triggering/synchronising (9kHz-6GHz)
-EMI measuring kit (spectrum analiser 10Hz-7GHz, antennas, probes)
-PCB prototyper
-Optical cable welder kit
-General electrical measuring devices (multimeters, power analyser, etc.)
-Touch protection measuring kit
-Data logger device (20 channel)

Mechanical Workshop

Description

Merge together traditional milling- and high-end CNC technology. Precision machining, welding, assembling, 3D coordinate measurements, CAM programming and rapid prototyping, just a few from the core capabilities.

-3D CNC milling machine, work area: 1300x700x700mm
-5D CNC milling machine, work area: 1000x560x550mm
-CNC lathe, 1000mm centre width
-General lathe 1000mm centre width, with glass scales
-General lathe 3000mm centre width, with glass scales
-2 pieces of general milling machine, work area: 930x430x600mm
-General milling machine, work area: 1200x550x600mm
-Surface grinding machine, work area: 600x1020mm
-2 pieces of column drilling machine
-Milling-drilling machine, work area: 500x250x540mm
-Metal band saw for sawing long rods
-Bench grinding machines
-Column drilling machine, work area: 400x640mm
-3D coordinate measuring machine, work area: 1000x700x600mm, accuracy: ±6µm
-CO welding machine
-AWI welding machine
-Mobile plasma cutter, max. thickness: 40mm
-Ultrasonic cleaners, 12L, 42L, 162L
-3D prototyping system Stratasys F170 3D printer for ABS, ASA and PLA materials up to 254mm^3 dimensions

Nano Science Laboratory

Description

Our main device at the Nano Science Laboratory of ELI-ALPS is a RAITH eLINE Plus electron beam lithography system with ultrahigh resolution. The system comprises of a scanning electron microscope based imaging tool equipped with fast electrostatic beam-blanking and pattern generator allowing the electron beam exposure of different resists along predefined routes/lines/shapes. The beam energy is selectable between 20 eV and 30keV. During electron beam exposure the x-y positioning of the sample is ensured by a laser interferometer controlled stage on a 100 mm x 100 mm travel range with 1 nm positioning resolution, and the device is equipped with an automated height sensing unit. The size of the write fields can be adjusted from 0.5 micron to 2 mm, the minimal beam size at 20 kV accelerating voltage is 1.6 nm. The minimum periodicity of the gratings produced by the system does not exceed 40 nm, and the minimum feature size is smaller than 8 nm. For imaging, the system is equipped with an off-axis Everhart-Thornley secondary electron detector and an in lens, combined secondary and backscattered electron detector. Analyzing the chemical composition of the investigated samples is also possible with an X-ray spectrometer and energy dispersive microanalysis system (EDS), capable to detect elements with atomic number between 5-95. The system is equipped with a 3D Module having a motorized arrangement for rotating and tilting samples of size 10 mm x 10 mm with tilt angles between 0 - 90 degree and rotation angles between 0 - 360 degree.

The laboratory has the equipment necessary for resist preparation, i.e. a spin-coater, a plasma cleaner, a hot-plate and ultrasonic bath are available.


Optical Metrology Laboratory

Description

As a member of the Optical Preparatory Workshops the Optical Metrology Lab is providing comprehensive optical measurement and characterization services. It works as the quality control laboratory for the incoming optics where all the specified parameters are investigated. Additionally the lab of course host the measurements for the in-house activities.

-Calipers (<=300mm; 0.01mm)
-Micrometers (<=100mm; 0.001mm)
-Indicators with granite stands (0.001mm)
-Protractor (1’)
-Visual inspection incl. microscopes
-Ionizing blow-off guns
-Laminar flow boxes (ISO3)
-Ultrasonic bath for cleaning

Spectrophotometer UV-Vis-NIR, PerkinElmer Lambda 1050 equipped with
-URA (Universal Reflectance Accessory) AOI=8÷65°
-DRA (Diffuse Reflectance Accessory), ø60mm and ø150mm integrating sphere
-GPOB (General Purpose of Optical Bench) for gratings and complex optical sub-systems
-175-3300nm

ZYGO laser interferometer for surface form measurements equipped with
λ/20@633nm reference plan/sphere for AR and HR coated optics respectively (no compromise with attenuators)

Spectrally resolved WL interferometer for spectral phase (GDD) measurements
-Vis-NIR spectral range (500-1400nm)
-Fits 0.5”-12” optics
-AOI=0÷50°; S- and P-pol respectively
-Accuracy ±10fs2

Spectroscopic Ellipsometer SEMILAB SE-2000 (rotating compensator)
-Phase and phase-shift characterisation
-UV-Vis-NIR range (193-1690nm)
-Complex indices investigation
-Anisotopic measurements
-Surface morphology and coating stack structures

Measuring equipment for Lenses and Optical systems
-+/- FL as well as BFL
-CX and CC radii
-Parallelism/wedge

Application oriented in-house systems
-Sources (WL, stab. HeNe, photodiodes, supercontinuum)
-Detectors (spectrometers for Vis-NIR range)


Optical Polishing Workshop

Description

As a member of the Optical Preparatory Workshops the Polishing workshop is dedicated to custom optical fabrication/finishing, including substrate refurbishing.

Every kind of geometrical attributes can be achieved in-house prepared from rough materials (glass, fused silica, crystals, metals and ceramics) within the dimensions dia. 10-200mm / radii 5-0mm. Optical, mechanical tolerances according to ISO standards.

5D CNC optical processing center (max. dia.250mm)
NC controlled Optic cutter
Laser interferometer (4" vertical) for surface form measurements
Traditional lever machine for precision polishing
Manual polishing machine for correction polishing    


Thin Film Coating Laboratory

Description

As a member of the Optical Preparatory Workshops the Thin Film Coating Lab is intended to serve any kind of custom optical multilayer coating request. In our facility we have a HV coating system equipped with a variety of deposition sources e.g. 2* resistance (thermal) sources for proper metal films, a multi-pocket electron beam source for dielectrics, with a KRI end-Hall ion-source for adequate substrate cleaning as well as ion-assisted deposition. Apart from that we have 2 magnetrons that can be switched between both from RF/DC power supplies in order to allow us to do sequential sputtering of complex multilayer structures if needed. For better homogeneity we have flat (for sputtering), calotte (semi-spherical for evaporation) and planetary gear substrate holders, due to different source characteristics. We use OptiLayer thin film software(s) to characterize, design and reverse-engineer coatings. This all comes with the flexibility to iterate problems directly with the colleagues/users in-house.


Vacuum Laboratory (Cleanroom service included)

Description

Vacuum technology and equipment assembly group is responsible to implementation related activities, especially vacuum, optics and optomechanics as well as cleanroom services. The group maintains a small complementary workshop that is dedicated to some milling capabilities allowing colleagues to modify mechanical parts in urgent cases; and has an off-line vacuum system for demonstration, training, measurement and calibration purposes. The group provide a variety of cleaning techniques based on the application that requires vacuum cleanliness. This of course comes with adequate metrology support.

-Column drilling machine
-D280x700mm centre width bench lathe
-Milling-drilling machine, work area: 280x175x280mm
-Part and ultrasonic cleaner

-RGA analysis, vacuum gauge calibration, specimen degassing rate measurement, etc

-dedicated and disposable cleanroom garments, cleanroom consumables and comprehensive maintenance service


contacts
Viktor Chikan
Techniques
Absorption
  • IR spectroscopy
  • Time-resolved studies
Diffraction
  • Time-resolved studies
Emission or Reflection
  • Reflectrometry
  • Time-resolved studies
  • X-ray excited optical luminescence (XEOL)
Disciplines
Chemistry
  • Other - Chemistry
Energy
  • Sustainable energy systems
Material Sciences
  • Knowledge based multifunctional materials
  • Other - Material Sciences
Physics
  • Astronomy/Astrophysics/Astroparticles
  • Atomic & molecular physics
Address
Szeged, Budapesti út 5, 6728 Hungary
control/Data analysis
Control Software Type
  • OPUS, Labview
Data Output Type
  • text or binary data
Data Output Format
  • ASCII data or spectrum images
Softwares For Data Analysis
  • Labview, PGopher
Equipment That Can Be Brought By The User
Detectors and imaging that can be attached to the standard vacuum chamber designed to investigate the dissociation of adiabatically cooled molecules.