Elettra
BL 05.2 L - SAXS

Small Angle X-ray Scattering is a non-destructive and highly versatile standard method to study the nanoscale structure of any type of material ranging from new composite nanosystems to biological macromolecules. Parameters as (i) average particle sizes, shapes and distributions, (ii) the materials' porosity as well as (iii) electron density maps with nanometer precision can be obtained. Simultaneously performed Wide Angle X-ray Scattering allows to determine additionally the degree of crystallinity. Sample materials can be solid, liquid or even gaseous-like as for instance aerosols.

 

The highflux SAXS beamline at Elettra has been built by the Institute of Biophysics and Nanosystems Research (IBN), Austrian Academy of Sciences, and is in user operation since September 1996. On 1st October 2012 the beamline was transfered from the IBN to the Institute of Inorganic Chemistry of Graz University of Technology.

 

The beamline was mainly intended for time-resolved studies on fast structural transitions in the sub-millisecond time region in solutions and partly ordered systems with a SAXS-resolution of at least 100 nm in real-space. But increasingly also grazing-incidence (GISAXS) measurements are performed to study self-assembly processes on surfaces, or to perform structural characterisations of thin films. Additionally SAXS measurements can be coupled to simultaneous Differential Scanning Calorimetry (DSC) and Wide Angle X-ray Scattering (WAXS) recordings. Users have the possibility to use our various sample holders (e.g., thermostated capillary holders, rapid mixing device, inline DSC; T-jump with IR laser; pressure cell, GISAXS holder, ...), or to install their own specialized sample equipment. More information can be found at http://www.elettra.eu/elettra-beamlines/saxs.html

 

Due to the highly variable kept sample stage, there are nearly no limits for the realization of an experiment, and you are welcome by our team to propose any interesting and high-lighting investigation for the benefit of materials and life sciences.

 

Beamline Resolving Power
2 * 10-3 [E/deltaE] @ 8000 [eV]
Beamline Energy Range
5.4 - 16 [keV]
Beamline Fixed Energy Value
5.4 [keV]
8 [keV]
16 [keV]
Max Flux On Sample
5 * 1012 [ph/s] @ 8000 [eV]
Spot Size On Sample Hor
20 - 4500 [um]
Spot Size On Sample Vert
20 - 1000 [um]
Divergence Hor
0 - 1 [mrad]
Divergence Vert
0 - 0.3 [mrad]
Photon Sources

Wiggler 2.0

Type
Wiggler
Available Polarization
Linear horizontal
Source Divergence Sigma
X = 1000 [urad], Y = 300 [urad]
Source Spectral Flux
1 * 1014 [ph/s/0.1%bw] @ 8000 [eV]
Energy Range
5 - 16 [keV]
Number Of Periods
57
Period
140 [mm]
contacts
Heinz AMENITSCH
Sigrid BERNSTORFF
Techniques
Scattering
  • Small angle scattering
  • Time-resolved scattering
  • Wide angle scattering
control/Data analysis
Control Software Type
  • Labview, and also special software for running certain instruments
Data Output Type
  • saxs pattern, diffraction pattern, temperature, pressure, force, ....
Data Output Format
  • depending on the used instrument software, mostly in Tiff (scattering patterns), or in ASCII (other parameters)
Softwares For Data Analysis
  • FIT2D, IGOR, custom made SAXS / GISAXS data evaluation programs
Equipment That Can Be Brought By The User
Due to the highly variable kept sample stage, there are nearly no limits for the realization of an experiment. Users are welcome to bring their own specialized equipment for their beamtimes. Please contact us well before your experiment in order to discuss all your experimental needs.