SMIS beamline (Spectroscopy and Microscopy in the Infrared using Synchrotron), is dedicated to micro-spectroscopy and imaging. It covers a large frequency domain (between 1 to 100 microns wavelength).
This spectromicroscopy beamline aims to deliver high brilliance infrared radiation in the 2.5-100 microns spectral range. The synchrotron beam is split to operate two systems working in parallel. The beamline is dedicated to microscopic analysis with 3 infrared microscopes, coupled to FTIR spectrometers, are used to study microns-size samples for a large variety of applications (biology, biomedical, soft matter, earth and environmental science, cultural heritage, astrophysics and high pressure science).
Home-built horizontal microscope, with large working distance, allows to study at very high pressure ( > 200 Gpa), at low temperature (LHe temperature) to high temeparature (800K).
A complementary Raman microscope equipped with three laser colors is available on demand for users.Near-field spectroscopy and micrroscopy using the SR and laser sources at 20 nm spatial resolution.