NANOSCOPIUM is a hard X-ray nanoprobe beamline, which is dedicated to fast scanning multi-modal and multi-lengthscale imaging. It offers simultaneous information in a quantitative manner and in the same experimental conditions, in 2D & 3D about the elemental composition, chemical speciation and sample morphology. Namely, Nanoscopium offers a large portfolio of complementary nano-imaging and spectro-microscopy methods, also in association with coherent diffraction imaging and full field micro-tomography techniques. The cutting edge multi-modal possibilities are available at the beamline at hierarchical length-scales in order to tailor, through several orders of magnitude, the field of view (µm-mm) and spatial resolution (35 nm – 1µm) to the experimental needs.

Available analytical techniques:

• X-Ray Fluorescence (XRF) nanoprobe: open for user applications
• X-ray Absorption Spectroscopy (XANES): open for user applications
• Full field X-ray microtomography: open for user applications
• XRF tomography: please contact the beamline scientists
• Absorption-, Phase-, and Dark Field contrast imaging & tomography: please contact the beamline scientists
• Coherent Diffraction Imaging (Ptychography): please contact the beamline scientists

Acquisition modes:

• 2D at multiple lengthscales
• 3D by full field microtomography tomography & scanning tomography
• Fast continuous sample scanning (FLYSCAN, multi-detector architecture) with down to ms dwell time/pixel
• Network architecture: 10 Gbits tailored to the au high data flux produced by the ensemble of detectors (1 TOctets per day)

Two nanoprobe stations are in exploitation in sequential mode:

FZP-based nanoprobe, CX2 :

• Nano-focusing optics: chromatic, FZP
• Fast multimodal and multi-lengthscale imaging with highest spatial resolution down to 35 nm by Ptychography
• Full field X-ray microtomography in absorption and phase contrast modes

KB-based nanoprobe, CX3 :

• Nanofocusing optics: chromatic,  KB (JTEC)
• Fast multimodal and multi-lengthscale imaging with spatial resolution down to 50 nm. High photon flux providing high analytical sensitivity (ppm range) for elemental and chemical speciation characterization