METROLOGIE beamline is a specifically designed tests facility for X-ray optics and Instrumentation R&D, characterization of optical components and detectors, test of new optical schemes and set-ups.

The beamline is composed by two branches which can be operated simultaneously: a soft X-ray branch [30 eV – 1800 eV] and a hard X-ray branch [100 eV – 40 keV, with access to the white beam]. Both branches use a two-axes UHV goniometer as experimental station. On the hard X-ray branch, this equipment is completed by an optical table (including adaptable positioning stages) for accomodating complex optical set-ups.