ANTARES is a soft X-ray source dedicated to high resolution Angle Resolved Photoelectron Spectroscopy (ARPES) with very high lateral resolution. This setup offers a spectroscopic non-destructive nano-probe named k-space nanoscope to deeply study the electronic structure of advanced materials using angle resolved photoemission spectroscopy with nano-scale lateral resolution (nanoARPES). The innovative scanning photoemission microscopy combines linear and angle sweeps of the samples to perform precise electronic band k-dispersion determinations using nano–ARPES technique. This spectro-microscope is fully compatible with a high resolution R4000 Scienta hemispherical analyser, ensuring the high energy and k space resolution to settle even tiny features in complex electronic band structures. The beamline was designed to cover a large energy photon range from 10 eV to 900 eV, which allows carrying our surface and bulking studies in diverse condensed matter fields. In particular, a complete chemical imaging of the samples can be obtained by detecting the core levels and their chemical shifts with lateral nano-scale resolution. The beamline uses two undulators as a source with high flux and adjustable circular and linear polarisation. The energy is selected by a high-resolution PGM monochromator presenting best efficiency and purity of the monochromatic light. The micro- and nano-ARPES measurements can be alternatively conducted with a spot light size of ≈ 120 mm and ≈ 30, respectively.